IOL Intermittent Life Test System

Huake Zhiyuan - IOL Intermittent Life Test System, designed for conducting continuous operating life and intermittent operating life tests on various packaged MOSFETs, IGBTs, transistors, and Diodes (low-current devices). The intermittent life test utilizes repeated high and low temperatures caused by the repeated switching on and off of the chip to accelerate the thermomechanical stress on various component materials and interfaces within the chip, verifying the ability of the packaging, internal bonding, etc., to withstand thermomechanical stress induced by chip operation.

Brand: Huake Zhiyuan
Name: Intermittent Life Test System
Model: HK-IOL-16H
Purpose: The intermittent life test utilizes repeated high and low temperatures caused by the repeated switching on and off of the chip to accelerate the thermomechanical stress on various

Product Details
★Main Technical Specifications and Performance:
Product Model: HK-IOL-16H
Product Name: Intermittent Life Test System
Compliance Standards:
Test circuits and methods meet the requirements of MIL-STD-750, GJB128, and AEC-Q101 related standards.

Suitable for intermittent life tests and steady-state life tests of diodes, transistors, MOSFETs, IGBTs, and other devices in various package forms.

Test Channels: 16 (one board per zone)
Test Capacity: 40×16=640 positions
Basic Functions: ①Each channel provides a set of independently programmable power supplies.
②For transistor and MOSFET device tests, partial or full Tj detection can be provided. Diode tests provide full Tj detection.
③For diodes, the test current range per position is 0～15A, and up to 60A test current can be provided after parallel connection. MOSFET and IGBT device tests provide 18W test power per position. By reducing the number of test positions, the test power of the device can be increased.
④External power supplies can be used, such as TDK, Agilent, and other brands.
Computer: Industrial-grade computer host, LCD monitor, dedicated keyboard, and mouse. WINDOWS operating interface, user-friendly human-machine dialogue window, powerful graphic editing capabilities, and a comprehensive device library for user selection. The software is easy to operate and learn. Additionally, the system features query and diagnostic functions, making test conditions clear at a glance and convenient for users to check at any time.
Aging Board: The aging board adopts a motherboard-daughterboard design, allowing for testing of devices with different packages by simply replacing the daughterboard.
Power Grid Requirements: Single-phase AC220V±10%, 47Hz~63Hz, 6KW
Dimensions: W1620mm×H1820mm×D1320mm
Weight: Approximately 600kg